@inproceedings{3a1743ae012f4125a17ef30b2abd2941,
title = "Weakly supervised deep learning for detecting and counting dead cells in microscopy images",
abstract = "Counting dead cells is a key step in evaluating the performance of chemotherapy treatment and drug screening. Deep convolutional neural networks (CNNs) can learn complex visual features, but require massive ground truth annotations which is expensive in biomedical experiments. Counting cells, especially dead cells, with very few ground truth annotations remains unexplored. In this paper, we automate dead cell counting using a weakly supervised strategy. We took advantage of the fact that cell death is low before chemotherapy treatment and increases after treatment. Motivated by the contrast, we first design image level supervised only classification neural networks to detect dead cells. Based on the class response map in classification networks, we calculate a Dead Confidence Map (DCM) to specify confidence of each dead cell. Associated with peak clustering, local maximums in the DCM are used to count the number of dead cells. In addition, a biological experiment based weakly supervised data preparation strategy is proposed to minimize human intervention. We show classification performance compared to general purpose and cell classification networks, and report results for the image-level supervised counting task.",
keywords = "Classification, Convolutional neural networks, Counting, Dead cells, Machine learning, Microscopy image, Weakly supervised learning",
author = "Siteng Chen and Ao Li and Kathleen Lasick and Julie Huynh and Powers, \{Linda S\} and Janet Roveda and Andrew Paek",
note = "Publisher Copyright: {\textcopyright} 2019 IEEE.; 18th IEEE International Conference on Machine Learning and Applications, ICMLA 2019 ; Conference date: 16-12-2019 Through 19-12-2019",
year = "2019",
month = dec,
doi = "10.1109/ICMLA.2019.00282",
language = "English (US)",
series = "Proceedings - 18th IEEE International Conference on Machine Learning and Applications, ICMLA 2019",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "1737--1743",
editor = "Wani, \{M. Arif\} and Khoshgoftaar, \{Taghi M.\} and Dingding Wang and Huanjing Wang and Naeem Seliya",
booktitle = "Proceedings - 18th IEEE International Conference on Machine Learning and Applications, ICMLA 2019",
}