Wavelet-based statistical health monitoring and fault diagnosis method

Wei Fan, Qiang Zhou

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

In this paper, a wavelet-based statistical method is proposed for health monitoring and fault diagnosis. This method integrates the statistical process control technology and the discrete wavelet transform. A statistical indicator based on discrete wavelet transform is constructed, and the X-bar chart is used to monitor the indicator. The fault frequency can be identified in the Hilbert envelope spectrum of the signal which is reconstructed by the out-of-control levels. Thus with the proposed method, one can not only detect a process change but also identify the fault type. An experimental study is conducted to demonstrate the effectiveness of the proposed method.

Original languageEnglish (US)
Title of host publicationProceedings - 2017 International Conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2017
EditorsWei Guo, Jose Valente de Oliveira, Chuan Li, Yun Bai, Ping Ding, Juanjuan Shi
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages334-338
Number of pages5
ISBN (Electronic)9781509040209
DOIs
StatePublished - Dec 9 2017
Event2017 International Conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2017 - Shanghai, China
Duration: Aug 16 2017Aug 18 2017

Publication series

NameProceedings - 2017 International Conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2017
Volume2017-December

Conference

Conference2017 International Conference on Sensing, Diagnostics, Prognostics, and Control, SDPC 2017
Country/TerritoryChina
CityShanghai
Period8/16/178/18/17

Keywords

  • Bearing fault
  • Fault diagnosis
  • Monitoring
  • SPC
  • Wavelet transform

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Safety, Risk, Reliability and Quality
  • Control and Optimization
  • Instrumentation

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