Abstract
A Mueller matrix spectropolarimeter operating between 400-900nm has been developed for optical element characterization at The University of Alabama in Huntsville. Mueller matrices are measured as a function of wavelength and the spectral behavior of the polarization properties can be determined. Measurements of an achromatic retarder in transmission, a reflective beamsplitter, and the electro-optic dispersion of a spatial light modulator will be presented.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 156-160 |
| Number of pages | 5 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 3121 |
| DOIs | |
| State | Published - 1997 |
| Externally published | Yes |
| Event | Polarization: Measurement, Analysis, and Remote Sensing - San Diego, CA, United States Duration: Jul 30 1997 → Aug 1 1997 |
Keywords
- Electro-optic dispersion
- Mueller matrix
- Spectropolarimetry
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering