VERY HIGH YIELD ELECTRON IMPACT ION SOURCE FOR ANALYTICAL MASS SPECTROMETRY.

S. L. Koontz, M. B. Denton

Research output: Contribution to conferencePaperpeer-review

Original languageEnglish (US)
Pages527-528
Number of pages2
StatePublished - 1982

ASJC Scopus subject areas

  • General Engineering

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