@inproceedings{9db171f7a58c4af6acc60de89ba4500e,
title = "Ultraviolet polarimeter for characterization of an imaging spectrometer",
abstract = "A polarimeter for characterization of the instrumental polarization of an imaging ultraviolet (UV) spectrometer has been designed and calibrated. The spectrometer is a diffraction grating spectrograph and is therefore expected to show strong polarization effects. Since the spectrometer is used for observations of partially polarized light, we need to measure the sensitivity of the spectrometer to the polarization state of incident light. A dual rotating retarder polarimeter has been developed to address this need. The polarimeter includes a linear diattenuator and a rotating retrader to control the polarization state of light entering the spectrometer, and a similar pair of elements to analyze the polarization state of light emerging from the instrument. With this polarimeter it is possible to measure the Mueller matrix of the spectrometer as a function of wavelength. In the course of calibrating the polarimeter, the quarter-wave retarders were observed to possess polarization properties other than pure linear retardance. This forced the development of a complex procedure for the calibration of the retarders and a new generalized approach to polarimetric analysis. These developments are the main subjects of this paper",
author = "Morgan, \{M. Frank\} and Chipman, \{A. Russell\} and Torr, \{G. Douglas\}",
year = "1990",
language = "English (US)",
isbn = "0819403725",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "Publ by Int Soc for Optical Engineering",
pages = "384--394",
editor = "Chipman, \{Russel A.\} and Morris, \{John W.\}",
booktitle = "Proceedings of SPIE - The International Society for Optical Engineering",
note = "Polarimetry: Radar, Infrared, Visible, Ultraviolet, and X-Ray ; Conference date: 15-05-1990 Through 17-05-1990",
}