Abstract
Gain for less than one picosecond is observed in a type II GaAs/AlAs multiple quantum well and compared to a type I multiple quantum well under the same conditions. A sophisticated three-beam experiment is used to unambiguously determine the internal gain of the samples. This method is capable of measuring very small amounts of gain and applicable to a wide variety of situations. The observations are well explained by a simple carrier scattering model.
Original language | English (US) |
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Pages (from-to) | 511-513 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 68 |
Issue number | 4 |
DOIs | |
State | Published - 1996 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)