Ultrafast non-equilibrium carrier dynamics in semiconductor laser mode-locking

I. Kilen, C. N. Böttge, J. Hader, S. W. Koch, J. V. Moloney

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

The mode-locking dynamics of a vertical external-cavity surface-emitting laser with saturable absorber is analyzed using a microscopic many-body theory. The light field is treated at the level of Maxwell’s equations and the quantum-wells are modeled using the semiconductor Bloch equations. The carrier relaxation and the polarization dephasing dynamics is treated at different levels of approximation ranging from a simple rate approximation to the second-Born-Markov level. Examples of mode-locked pulse generation are presented identifying the regimes for stable ultra-short pulses, multiple pulse generation, and instability.

Original languageEnglish (US)
Title of host publicationVertical External Cavity Surface Emitting Lasers (VECSELs) V
EditorsMircea Guina
PublisherSPIE
ISBN (Electronic)9781628414394
DOIs
StatePublished - 2015
EventVertical External Cavity Surface Emitting Lasers (VECSELs) V - San Francisco, United States
Duration: Feb 9 2015Feb 10 2015

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume9349
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Other

OtherVertical External Cavity Surface Emitting Lasers (VECSELs) V
Country/TerritoryUnited States
CitySan Francisco
Period2/9/152/10/15

Keywords

  • GaAs
  • RPG
  • SESAM
  • VECSELs
  • kinetic holes
  • mode-locking
  • semiconductor Bloch equations
  • semiconductor laser
  • simulation

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

Fingerprint

Dive into the research topics of 'Ultrafast non-equilibrium carrier dynamics in semiconductor laser mode-locking'. Together they form a unique fingerprint.

Cite this