Skip to main navigation Skip to search Skip to main content

Ultrafast atomic-scale structural response in monolayer and multilayer transition metal dichalcogenides

  • E. M. Mannebach
  • , I. C. Tung
  • , C. Nyby
  • , H. Zhou
  • , Q. Zhang
  • , F. Ernst
  • , K. Seyler
  • , G. Clark
  • , Y. Lin
  • , D. Zhu
  • , J. Glownia
  • , M. Kozina
  • , S. Song
  • , S. Nelson
  • , Y. Yu
  • , A. Pant
  • , A. Raja
  • , Y. Guo
  • , A. D. Di Chiara
  • , W. Mao
  • L. Cao, S. Tongay, T. F. Heinz, X. Xu, H. Wen, A. M. Lindenberg

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Femtosecond x-ray studies of 2D transition metal dichalcogenide films reveal ultrafast in-plane and out-of-plane responses, including compression of the out-of-plane lattice spacing, structure factor modulations, and in-plane dynamics occurring on few picosecond time scales.

Original languageEnglish (US)
Title of host publicationInternational Conference on Ultrafast Phenomena, UP 2016
PublisherOptica Publishing Group (formerly OSA)
ISBN (Print)9781943580187
DOIs
StatePublished - Jul 18 2016
Externally publishedYes
EventInternational Conference on Ultrafast Phenomena, UP 2016 - Santa Fe, United States
Duration: Jul 17 2016Jul 22 2016

Publication series

NameOptics InfoBase Conference Papers
ISSN (Electronic)2162-2701

Other

OtherInternational Conference on Ultrafast Phenomena, UP 2016
Country/TerritoryUnited States
CitySanta Fe
Period7/17/167/22/16

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Mechanics of Materials

Fingerprint

Dive into the research topics of 'Ultrafast atomic-scale structural response in monolayer and multilayer transition metal dichalcogenides'. Together they form a unique fingerprint.

Cite this