Abstract
A two-dimensional coherent imaging equation is derived for confocal self-interference microscopy (CSIM), which uses a birefringent material to generate an interference pattern in the detection optics. This interference pattern, called a self-interference pattern, sharpens the point-spread function (PSF) along the lateral direction. To derive the imaging equation, an equation for the self-interference pattern is derived. Numerical simulation results based on the imaging equation are presented. One-point response results show a 42.8% reduction in the FWHM of the lateral PSF. Two-point response results show a nearly twofold improvement in two-point resolution.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 2737-2745 |
| Number of pages | 9 |
| Journal | Journal of the Optical Society of America A: Optics and Image Science, and Vision |
| Volume | 22 |
| Issue number | 12 |
| DOIs | |
| State | Published - Dec 2005 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Computer Vision and Pattern Recognition