Two-dimensional Fourier domain Ronchi ruling measurement using Talbot-based crossing point modeling

Sukmock Lee, Dae Wook Kim

Research output: Contribution to journalArticlepeer-review

2 Scopus citations

Abstract

We propose a direct two-dimensional Fourier domain fitting-free method to determine the period of a Ronchi ruling. A precise method to measure a spatial frequency target's quality and fidelity is highly desired as the pattern period directly affects every aspect of a spatial frequency target-based metrology, including the accuracy and precision of the measurement or evaluations. A standard Talbot experimental apparatus and the Talbot effect are used to obtain and model our data. To determine the period of the ruling directly, only a common digital camera, with a protective glass and an air gap in front of the sensor array, and a Ronchi ruling of chrome deposited on a glass substrate are required. The Talbot effect-based crossing point modeling technique requires no calibration or a priori information but simply the pixel size of the digital camera and a precise means of measuring the spatial frequency from a Talbot image. For a Ronchi ruling with a period specification of 0.1 mm, the nanometric measurement was found to be 0.100010 mm with an error level of 5 nm.

Original languageEnglish (US)
Article number014106
JournalOptical Engineering
Volume59
Issue number1
DOIs
StatePublished - Jan 2020

Keywords

  • Fourier analysis
  • period measurement
  • Ronchi ruling
  • Talbot effect

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • General Engineering

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