TOWARDS DIFFRACTION-LIMITED X-RAY OPTICS

  • Mallory M. Whalen
  • , Alan Garner
  • , Sarah N.T. Heine
  • , Brandon D. Chalifoux
  • , Herman L. Marshall
  • , Ralf K. Heilmann
  • , Mark L. Schattenburg

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Improvements to the surface metrology of highly off-axis, conic section optical surfaces are presented as they relate to grazing incidence X-ray mirrors for soft X-ray wavelengths. Improved surface metrology of ellipsoidal mirrors at visible wavelengths will be used to generate surface maps for ion-beam figuring. The metrology advances will be validated by comparing the X-ray Point Spread Functions (PSF) produced before and after mirror figuring. X-ray optical alignment techniques of ellipsoidal mirrors as well as at wavelength (6.76 nm) metrology will also be discussed.

Original languageEnglish (US)
Title of host publicationProceedings - ASPE 2024 Annual Meeting
PublisherAmerican Society for Precision Engineering, ASPE
Pages44-47
Number of pages4
ISBN (Electronic)9781887706612
StatePublished - 2024
Event39th Annual Meeting of the American Society for Precision Engineering, ASPE 2024 - Houston, United States
Duration: Nov 5 2024Nov 8 2024

Publication series

NameProceedings - ASPE 2024 Annual Meeting

Conference

Conference39th Annual Meeting of the American Society for Precision Engineering, ASPE 2024
Country/TerritoryUnited States
CityHouston
Period11/5/2411/8/24

ASJC Scopus subject areas

  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Industrial and Manufacturing Engineering
  • Mechanical Engineering
  • Instrumentation

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