Abstract
A Total Integrated Scatter (TIS) system was built to test the viability of a TIS instrument to be used in space to monitor damage to optical and thermal control surfaces due to the low earth orbit environment. The systems accuracy and repeatability in detecting changes in the surface quality of various space materials after exposure to atomic oxygen was tested. A method for distinguishing roughening of a surface from dust contamination is described.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 200-210 |
| Number of pages | 11 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 1329 |
| State | Published - 1990 |
| Externally published | Yes |
| Event | Optical System Contamination: Effects, Measurement, Control II - San Diego, CA, USA Duration: Jul 10 1990 → Jul 12 1990 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering