Total Integrated Scatter instrument for in-space monitoring of surface degradation

Joseph Larry Pezzaniti, James B. Hadaway, Russell A. Chipman, Don Wilkes, Lee Hummer, Jean Bennett

Research output: Contribution to journalConference articlepeer-review

3 Scopus citations


A Total Integrated Scatter (TIS) system was built to test the viability of a TIS instrument to be used in space to monitor damage to optical and thermal control surfaces due to the low earth orbit environment. The systems accuracy and repeatability in detecting changes in the surface quality of various space materials after exposure to atomic oxygen was tested. A method for distinguishing roughening of a surface from dust contamination is described.

Original languageEnglish (US)
Pages (from-to)200-210
Number of pages11
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - 1990
EventOptical System Contamination: Effects, Measurement, Control II - San Diego, CA, USA
Duration: Jul 10 1990Jul 12 1990

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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