Total-Dose Radiation Effects on Sol-Gel Derived PZT Thin Films

S. C. Lee; R. D. Schrimpf; K. F. Galloway; G. Teowee; D. P. Birnie; D. R. Uhlmann

doi:10.1109/23.211401

Total-Dose Radiation Effects on Sol-Gel Derived PZT Thin Films

S. C. Lee
, R. D. Schrimpf
, K. F. Galloway
, G. Teowee
, D. P. Birnie
, D. R. Uhlmann

Research output: Contribution to journal › Article › peer-review

49 Scopus citations

Abstract

Sol-Gel derived PZT thin films were irradiated to a total-dose of 1 Mrad(Si), or 86 krad(PZT), under open circuit bias. An asymmetric distortion in the hysteresis curves was observed. The distortion depends on the polarization state of the capacitor before irradiation. Post-irradiation electrical cycling makes the hysteresis loops symmetric initially, but results in fatigue effects. The leakage and switching current behavior after irradiation and post-rad cycling were studied using a static current vs. voltage measurement. Mechanisms of radiation-induced distortion and the fatigue effect during post-rad cycling are discussed.

Original language	English (US)
Pages (from-to)	2036-2043
Number of pages	8
Journal	IEEE Transactions on Nuclear Science
Volume	39
Issue number	6
DOIs	https://doi.org/10.1109/23.211401
State	Published - Dec 1992

ASJC Scopus subject areas

Nuclear and High Energy Physics
Nuclear Energy and Engineering
Electrical and Electronic Engineering

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10.1109/23.211401

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title = "Total-Dose Radiation Effects on Sol-Gel Derived PZT Thin Films",

abstract = "Sol-Gel derived PZT thin films were irradiated to a total-dose of 1 Mrad(Si), or 86 krad(PZT), under open circuit bias. An asymmetric distortion in the hysteresis curves was observed. The distortion depends on the polarization state of the capacitor before irradiation. Post-irradiation electrical cycling makes the hysteresis loops symmetric initially, but results in fatigue effects. The leakage and switching current behavior after irradiation and post-rad cycling were studied using a static current vs. voltage measurement. Mechanisms of radiation-induced distortion and the fatigue effect during post-rad cycling are discussed.",

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note = "Funding Information: *This work was supported in part by the U. S. Navy through contract number N00014-90-C-2310 and in part by the Air Force Office of Scientific Research.",

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AU - Lee, S. C.

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AU - Galloway, K. F.

AU - Teowee, G.

AU - Birnie, D. P.

AU - Uhlmann, D. R.

N1 - Funding Information: *This work was supported in part by the U. S. Navy through contract number N00014-90-C-2310 and in part by the Air Force Office of Scientific Research.

PY - 1992/12

Y1 - 1992/12

N2 - Sol-Gel derived PZT thin films were irradiated to a total-dose of 1 Mrad(Si), or 86 krad(PZT), under open circuit bias. An asymmetric distortion in the hysteresis curves was observed. The distortion depends on the polarization state of the capacitor before irradiation. Post-irradiation electrical cycling makes the hysteresis loops symmetric initially, but results in fatigue effects. The leakage and switching current behavior after irradiation and post-rad cycling were studied using a static current vs. voltage measurement. Mechanisms of radiation-induced distortion and the fatigue effect during post-rad cycling are discussed.

AB - Sol-Gel derived PZT thin films were irradiated to a total-dose of 1 Mrad(Si), or 86 krad(PZT), under open circuit bias. An asymmetric distortion in the hysteresis curves was observed. The distortion depends on the polarization state of the capacitor before irradiation. Post-irradiation electrical cycling makes the hysteresis loops symmetric initially, but results in fatigue effects. The leakage and switching current behavior after irradiation and post-rad cycling were studied using a static current vs. voltage measurement. Mechanisms of radiation-induced distortion and the fatigue effect during post-rad cycling are discussed.

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Total-Dose Radiation Effects on Sol-Gel Derived PZT Thin Films

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