The timing characteristics of a planar Cd1-xZnxTe sample at each frequency of a scanning square-wave test pattern, has been measured. This study is aimed at evaluating the speed characteristics of a Cd1-xZnxTe detector for X-ray imaging and computed tomographic (CT) applications. The experimental results of this study indicate that the temporal response of a Cd1-xZnxTe detector based X-ray system, improves significantly by optimizing the X-ray tube and detector parameters.
ASJC Scopus subject areas
- Electrical and Electronic Engineering