Third-order intermodulation distortion in YBa2Cu3O7-δ grain boundaries

H. Xin; D. E. Oates; G. Dresselhaus; M. S. Dresselhaus

doi:10.1103/PhysRevB.65.214533

Third-order intermodulation distortion in YBa₂Cu₃O_7-δ grain boundaries

H. Xin, D. E. Oates, G. Dresselhaus, M. S. Dresselhaus

Research output: Contribution to journal › Article › peer-review

18 Scopus citations

Abstract

Results are presented on the microwave intermodulation distortion (IMD) measured in high-temperature-superconducting YBa₂Cu₃O_7-δ engineered grain boundaries fabricated on bicrystal substrates. The two-tone IMD at 4.4 GHz of thin YBCO plain films without engineered grain boundaries and films with engineered bicrystal grain boundaries of misorientation-angles from 2° to 24° was measured as a function of microwave power and temperature in a suspended microstrip resonator configuration. The microwave power dependence of the IMD of the plain films and the films with grain boundaries is compared. The long Josephson-junction effects of high-angle grain boundaries were studied. The connection between the results for the microwave impedance of YBCO grain boundaries and for the IMD has been modeled. We find that for grain boundaries of less than 7.5°, the IMD is indistinguishable from that of the plain film.

Original language	English (US)
Article number	214533
Pages (from-to)	2145331-2145335
Number of pages	5
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	65
Issue number	21
DOIs	https://doi.org/10.1103/PhysRevB.65.214533
State	Published - Jun 1 2002

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1103/PhysRevB.65.214533

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@article{aaa1a535b50546f28ceb58bb8cb382e7,

title = "Third-order intermodulation distortion in YBa2Cu3O7-δ grain boundaries",

abstract = "Results are presented on the microwave intermodulation distortion (IMD) measured in high-temperature-superconducting YBa2Cu3O7-δ engineered grain boundaries fabricated on bicrystal substrates. The two-tone IMD at 4.4 GHz of thin YBCO plain films without engineered grain boundaries and films with engineered bicrystal grain boundaries of misorientation-angles from 2° to 24° was measured as a function of microwave power and temperature in a suspended microstrip resonator configuration. The microwave power dependence of the IMD of the plain films and the films with grain boundaries is compared. The long Josephson-junction effects of high-angle grain boundaries were studied. The connection between the results for the microwave impedance of YBCO grain boundaries and for the IMD has been modeled. We find that for grain boundaries of less than 7.5°, the IMD is indistinguishable from that of the plain film.",

author = "H. Xin and Oates, {D. E.} and G. Dresselhaus and Dresselhaus, {M. S.}",

year = "2002",

month = jun,

day = "1",

doi = "10.1103/PhysRevB.65.214533",

language = "English (US)",

volume = "65",

pages = "2145331--2145335",

journal = "Physical Review B-Condensed Matter",

issn = "0163-1829",

publisher = "American Institute of Physics Publising LLC",

number = "21",

}

TY - JOUR

T1 - Third-order intermodulation distortion in YBa2Cu3O7-δ grain boundaries

AU - Xin, H.

AU - Oates, D. E.

AU - Dresselhaus, G.

AU - Dresselhaus, M. S.

PY - 2002/6/1

Y1 - 2002/6/1

N2 - Results are presented on the microwave intermodulation distortion (IMD) measured in high-temperature-superconducting YBa2Cu3O7-δ engineered grain boundaries fabricated on bicrystal substrates. The two-tone IMD at 4.4 GHz of thin YBCO plain films without engineered grain boundaries and films with engineered bicrystal grain boundaries of misorientation-angles from 2° to 24° was measured as a function of microwave power and temperature in a suspended microstrip resonator configuration. The microwave power dependence of the IMD of the plain films and the films with grain boundaries is compared. The long Josephson-junction effects of high-angle grain boundaries were studied. The connection between the results for the microwave impedance of YBCO grain boundaries and for the IMD has been modeled. We find that for grain boundaries of less than 7.5°, the IMD is indistinguishable from that of the plain film.

AB - Results are presented on the microwave intermodulation distortion (IMD) measured in high-temperature-superconducting YBa2Cu3O7-δ engineered grain boundaries fabricated on bicrystal substrates. The two-tone IMD at 4.4 GHz of thin YBCO plain films without engineered grain boundaries and films with engineered bicrystal grain boundaries of misorientation-angles from 2° to 24° was measured as a function of microwave power and temperature in a suspended microstrip resonator configuration. The microwave power dependence of the IMD of the plain films and the films with grain boundaries is compared. The long Josephson-junction effects of high-angle grain boundaries were studied. The connection between the results for the microwave impedance of YBCO grain boundaries and for the IMD has been modeled. We find that for grain boundaries of less than 7.5°, the IMD is indistinguishable from that of the plain film.

UR - http://www.scopus.com/inward/record.url?scp=0036611724&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0036611724&partnerID=8YFLogxK

U2 - 10.1103/PhysRevB.65.214533

DO - 10.1103/PhysRevB.65.214533

M3 - Article

AN - SCOPUS:0036611724

VL - 65

SP - 2145331

EP - 2145335

JO - Physical Review B-Condensed Matter

JF - Physical Review B-Condensed Matter

SN - 0163-1829

IS - 21

M1 - 214533

ER -

Third-order intermodulation distortion in YBa₂Cu₃O_7-δ grain boundaries

Abstract

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