Third-order intermodulation distortion in (formula presented) grain boundaries

Hao Xin, D. E. Oates, G. Dresselhaus, M. S. Dresselhaus

Research output: Contribution to journalArticlepeer-review


Results are presented on the microwave intermodulation distortion (IMD) measured in high-temperature-superconducting (formula presented) engineered grain boundaries fabricated on bicrystal substrates. The two-tone IMD at 4.4 GHz of thin YBCO plain films without engineered grain boundaries and films with engineered bicrystal grain boundaries of misorientation angles from (formula presented) to (formula presented) was measured as a function of microwave power and temperature in a suspended microstrip resonator configuration. The microwave power dependence of the IMD of the plain films and the films with grain boundaries is compared. The long Josephson-junction effects of high-angle grain boundaries were studied. The connection between the results for the microwave impedance of YBCO grain boundaries and for the IMD has been modeled. We find that for grain boundaries of less than 7.5°, the IMD is indistinguishable from that of the plain film.

Original languageEnglish (US)
Pages (from-to)1-5
Number of pages5
JournalPhysical Review B - Condensed Matter and Materials Physics
Issue number21
StatePublished - 2002

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


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