Thin-film chemical sensors with waveguide Zeeman interferometry

P. Äyräs, S. Honkanen, K. M. Grace, K. Shrouf, P. Katila, M. Leppihalme, A. Tervonen, X. Yang, B. Swanson, N. Peyghambarian

Research output: Contribution to journalArticlepeer-review

6 Scopus citations


We describe a highly sensitive chemical sensor scheme using a Si3N4 channel waveguide with a selective surface coating based on polarimetric Zeeman interferometry. The sensing is based on measurement of the phase difference between TE and TM modes propagating in the anisotropic waveguide structure under exposure to toluene vapour. A real-time and reversible response at low ppm level is observed. Modelling results of the sensor structure to further increase its sensitivity are presented.

Original languageEnglish (US)
Pages (from-to)1261-1271
Number of pages11
JournalPure and Applied Optics (Print edition) (United Kingdom)
Issue number6
StatePublished - Nov 1998

ASJC Scopus subject areas

  • General Engineering
  • General Physics and Astronomy


Dive into the research topics of 'Thin-film chemical sensors with waveguide Zeeman interferometry'. Together they form a unique fingerprint.

Cite this