Thickness dependent perpendicular magnetic domain patterns in sputtered epitaxial FePt(001) L10 films

J. U. Thiele, L. Folks, M. F. Toney, D. K. Weller

Research output: Contribution to journalConference articlepeer-review

4 Scopus citations


The present paper discusses the magnetic anisotropy and magnetic domain structure of highly ordered epitaxial FePt(001) films grown on Pt seeded MgO(001) substrates. These films were grown by dc-magnetron sputtering from a Fe50Pt50 alloy target at a substrate temperature of 550 °C during deposition. Thicknesses were varied between 15 and 170 nm. The presence of the highly anisotropic face centered tetragonal L10 crystal structure with a maximum long range chemical ordering of 95% and a low degree of misorientations was confirmed by specular and grazing incidence X-ray diffraction measurements. For film thicknesses ≥ 50 nm in-plane and out-of-plane hysteresis measurements indicate large perpendicular magnetic anisotropy and at the same time low remanent magnetisation. Magnetic force microscopy reveal highly interconnected perpendicular stripe domain patterns. From their characteristic width, which is strongly dependent on the film thickness, a value of the dipolar length, D0, of 50 ±5 nm is derived. Assuming an exchange constant of 10-6 erg/cm, this value is consistent with an anisotropy constant KU approx. 1.108 erg/cc.

Original languageEnglish (US)
Pages (from-to)319-324
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
StatePublished - 1998
Externally publishedYes
EventProceedings of the 1998 MRS Spring Symposium - San Francisco, CA, USA
Duration: Apr 15 1998Apr 16 1998

ASJC Scopus subject areas

  • General Materials Science
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


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