Abstract
The Slicer Combined with Array of Lenslets for Exoplanet Spectroscopy (SCALES) is a 2 − 5 µm, high-contrast integral field spectrograph (IFS) currently being built for Keck Observatory. With both low (R ≲ 250) and medium (R ∼ 3500 − 7000) spectral resolution IFS modes, SCALES will detect and characterize significantly colder exoplanets than those accessible with near-infrared (∼ 1 − 2 µm) high-contrast spectrographs. This will lead to new progress in exoplanet atmospheric studies, including detailed characterization of benchmark systems that will advance the state of the art of atmospheric modeling. SCALES’ unique modes, while designed specifically for direct exoplanet characterization, will enable a broader range of novel (exo)planetary observations as well as galactic and extragalactic studies. Here we present the science cases that drive the design of SCALES. We describe an end-to-end instrument simulator that we use to track requirements, and show simulations of expected science yields for each driving science case. We conclude with a discussion of preparations for early science when the instrument sees first light in ∼ 2025.
Original language | English (US) |
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Title of host publication | Techniques and Instrumentation for Detection of Exoplanets XI |
Editors | Garreth J. Ruane |
Publisher | SPIE |
ISBN (Electronic) | 9781510665743 |
DOIs | |
State | Published - 2023 |
Event | Techniques and Instrumentation for Detection of Exoplanets XI 2023 - San Diego, United States Duration: Aug 21 2023 → Aug 24 2023 |
Publication series
Name | Proceedings of SPIE - The International Society for Optical Engineering |
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Volume | 12680 |
ISSN (Print) | 0277-786X |
ISSN (Electronic) | 1996-756X |
Conference
Conference | Techniques and Instrumentation for Detection of Exoplanets XI 2023 |
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Country/Territory | United States |
City | San Diego |
Period | 8/21/23 → 8/24/23 |
Keywords
- Keck Observatory
- SCALES
- Solar System
- exoplanets
- integral field spectroscopy
- protoplanetary disks
- protoplanets
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering