TY - GEN
T1 - The Science of Electronics in Extreme Electromagnetic Environments II-Circuit Effects
AU - Hemmady, Sameer
AU - Schamiloglu, Edl
AU - Zarkesh-Ha, Payman
AU - Balakrishnan, Ganesh
AU - Heileman, Greg
AU - Dietz, David
AU - Portillo, Salvador
AU - Martinez-Ramon, Manel
AU - Antonsen, Thomas M.
AU - Goldsman, Neil
AU - Waks, Edo
N1 - Funding Information:
ACKNOWLEDGEMENT This work is supported by AFOSR/AFRL COE Grant #FA9550-15-1-0171 and AFOSR DURIP Grant # FA9550-15-1-0379.
Publisher Copyright:
© 2021 The authors; USNC-URSI and IEEE will have full rights to publish, market, put on Xplore, etc.
PY - 2021/1/4
Y1 - 2021/1/4
N2 - This abstract covers Part-II of a two-part presentation series on the scientific advancements made in the AFOSR/AFRL Center of Excellence (CoE) for Electronics in Extreme Electromagnetic Environments, spanning the time-period 2015-present. In specific, this presentation focuses on the development and experimental validation of statistical and deterministic physics-based predictive models describing the functional state of electronic devices (semiconductor, electro-optic and quantum), and the amalgamation of these devices to circuits and subcomponents, when subjected to extreme electromagnetic interference (EEMI). This presentation follows a companion presentation [1] which discusses the development and experimental validation of statistical and deterministic physics-based models describing coupling paradigms for EEMI in complicated enclosures which houses these sensitive electronic devices, circuits and subcomponents. Taken together, the two presentations advance the state-of-the-art in fundamental physics-based modeling of current and future electronic technologies in extreme electromagnetic environments.
AB - This abstract covers Part-II of a two-part presentation series on the scientific advancements made in the AFOSR/AFRL Center of Excellence (CoE) for Electronics in Extreme Electromagnetic Environments, spanning the time-period 2015-present. In specific, this presentation focuses on the development and experimental validation of statistical and deterministic physics-based predictive models describing the functional state of electronic devices (semiconductor, electro-optic and quantum), and the amalgamation of these devices to circuits and subcomponents, when subjected to extreme electromagnetic interference (EEMI). This presentation follows a companion presentation [1] which discusses the development and experimental validation of statistical and deterministic physics-based models describing coupling paradigms for EEMI in complicated enclosures which houses these sensitive electronic devices, circuits and subcomponents. Taken together, the two presentations advance the state-of-the-art in fundamental physics-based modeling of current and future electronic technologies in extreme electromagnetic environments.
UR - http://www.scopus.com/inward/record.url?scp=85100921424&partnerID=8YFLogxK
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U2 - 10.23919/USNC-URSINRSM51531.2021.9336483
DO - 10.23919/USNC-URSINRSM51531.2021.9336483
M3 - Conference contribution
AN - SCOPUS:85100921424
T3 - 2021 United States National Committee of URSI National Radio Science Meeting, USNC-URSI NRSM 2021 - Proceedings
SP - 19
EP - 20
BT - 2021 United States National Committee of URSI National Radio Science Meeting, USNC-URSI NRSM 2021 - Proceedings
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2021 United States National Committee of URSI National Radio Science Meeting, USNC-URSI NRSM 2021
Y2 - 4 January 2021 through 9 January 2021
ER -