The Effects of Focal Plane Parameters on eSWIR Imaging System Performance

A. Hendrick, L. Wiley, S. Velicu, R. Pimpinella, J. Lund, R. Driggers

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In the last half-decade, the extended shortwave infrared (eSWIR) atmospheric band has become a focus of investigation for its potential to provide better object discrimination at range than the visible, as well as the near, shortwave, midwave, and longwave infrared bands, particularly in degraded visual environments such as smoke, dust, and smog. However, any detection band is only as useful as the best available detector, and thus an investigation into the design of detectors for use in the eSWIR band is necessary before standards are established and applications put into practice. This study examines the relationship between detector parameters and targeting performance in the eSWIR band for both passive and active detection. The effects of pixel pitch, dark current, read noise, frame rate, quantum efficiency, and well depth are examined and ranked in importance to an eSWIR system’s performance.

Original languageEnglish (US)
Title of host publicationInfrared Imaging Systems
Subtitle of host publicationDesign, Analysis, Modeling, and Testing XXXV
EditorsDavid P. Haefner, Gerald C. Holst
PublisherSPIE
ISBN (Electronic)9781510674080
DOIs
StatePublished - 2024
EventInfrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXV 2024 - National Harbor, United States
Duration: Apr 23 2024Apr 25 2024

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13045
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceInfrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXV 2024
Country/TerritoryUnited States
CityNational Harbor
Period4/23/244/25/24

Keywords

  • active imaging
  • dark current
  • eSWIR
  • focal plane
  • FPA
  • frame rate
  • infrared
  • LRG
  • pixel pitch
  • qe
  • read noise
  • well depth

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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