The effect of metallic impurities on the dielectric breakdown of oxides and some new ways of avoiding them

S. Verhaverbeke, M. Meuris, P. W. Mertens, M. M. Heyns, Ara Philipossian, D. Graf, A. Schnegg

Research output: Chapter in Book/Report/Conference proceedingConference contribution

50 Scopus citations

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Engineering & Materials Science

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Chemical Compounds