The effect of dielectric loss in FDTD simulations of microstrip structures

David C. Wittwer; Richard W. Ziolkowski

doi:10.1109/22.903085

The effect of dielectric loss in FDTD simulations of microstrip structures

David C. Wittwer, Richard W. Ziolkowski

Electrical and Computer Engineering

Research output: Contribution to journal › Article › peer-review

14 Scopus citations

Abstract

The importance of dielectric losses in planar microstrip structures is evaluated with the finite-difference time-domain (FDTD) method. This analysis was previously not possible in many FDTD simulators due to a lack of absorbing boundary conditions (ABCs), which appropriately terminate air/dielectric interfaces for which the dielectric is lossy. The newly proposed lossy two-time derivative Lorentzian material (L2TDLM) model ABC allows for these terminations and is presented and implemented here for three-dimensional FDTD simulations. The effect of dielectric losses on several well-known planar microstrip structures is evaluated. It is shown that the inclusion of these losses in FDTD simulations, which is facilitated by the L2TDLM ABC, is, in fact, important to predict the performance of resonant structure on lossy dielectric substrates.

Original language	English (US)
Pages (from-to)	250-262
Number of pages	13
Journal	IEEE Transactions on Microwave Theory and Techniques
Volume	49
Issue number	2
DOIs	https://doi.org/10.1109/22.903085
State	Published - 2001

Keywords

Finite-difference methods
Microwave circuits
Microwave measurements
Numerical analysis

ASJC Scopus subject areas

Radiation
Condensed Matter Physics
Electrical and Electronic Engineering

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10.1109/22.903085

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@article{b63d659792444312b7e1699a9542e080,

title = "The effect of dielectric loss in FDTD simulations of microstrip structures",

abstract = "The importance of dielectric losses in planar microstrip structures is evaluated with the finite-difference time-domain (FDTD) method. This analysis was previously not possible in many FDTD simulators due to a lack of absorbing boundary conditions (ABCs), which appropriately terminate air/dielectric interfaces for which the dielectric is lossy. The newly proposed lossy two-time derivative Lorentzian material (L2TDLM) model ABC allows for these terminations and is presented and implemented here for three-dimensional FDTD simulations. The effect of dielectric losses on several well-known planar microstrip structures is evaluated. It is shown that the inclusion of these losses in FDTD simulations, which is facilitated by the L2TDLM ABC, is, in fact, important to predict the performance of resonant structure on lossy dielectric substrates.",

keywords = "Finite-difference methods, Microwave circuits, Microwave measurements, Numerical analysis",

author = "Wittwer, {David C.} and Ziolkowski, {Richard W.}",

note = "Funding Information: Manuscript received October 6, 1998. The work of D. C. Wittwer was supported in part by the Radar Design Center, Raytheon Systems Company, under the Doctoral Fellowship Program. The work of R. W. Ziolkowski was supported in part by the Office of Naval Research under Grant N0014-95-1-0636 and by the Air Force Office of Scientific Research, Air Force Material Command, USAF, under Grant F49620-96-1-0039.",

year = "2001",

doi = "10.1109/22.903085",

language = "English (US)",

volume = "49",

pages = "250--262",

journal = "IEEE Transactions on Microwave Theory and Techniques",

issn = "0018-9480",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

number = "2",

}

TY - JOUR

T1 - The effect of dielectric loss in FDTD simulations of microstrip structures

AU - Wittwer, David C.

AU - Ziolkowski, Richard W.

N1 - Funding Information: Manuscript received October 6, 1998. The work of D. C. Wittwer was supported in part by the Radar Design Center, Raytheon Systems Company, under the Doctoral Fellowship Program. The work of R. W. Ziolkowski was supported in part by the Office of Naval Research under Grant N0014-95-1-0636 and by the Air Force Office of Scientific Research, Air Force Material Command, USAF, under Grant F49620-96-1-0039.

PY - 2001

Y1 - 2001

N2 - The importance of dielectric losses in planar microstrip structures is evaluated with the finite-difference time-domain (FDTD) method. This analysis was previously not possible in many FDTD simulators due to a lack of absorbing boundary conditions (ABCs), which appropriately terminate air/dielectric interfaces for which the dielectric is lossy. The newly proposed lossy two-time derivative Lorentzian material (L2TDLM) model ABC allows for these terminations and is presented and implemented here for three-dimensional FDTD simulations. The effect of dielectric losses on several well-known planar microstrip structures is evaluated. It is shown that the inclusion of these losses in FDTD simulations, which is facilitated by the L2TDLM ABC, is, in fact, important to predict the performance of resonant structure on lossy dielectric substrates.

AB - The importance of dielectric losses in planar microstrip structures is evaluated with the finite-difference time-domain (FDTD) method. This analysis was previously not possible in many FDTD simulators due to a lack of absorbing boundary conditions (ABCs), which appropriately terminate air/dielectric interfaces for which the dielectric is lossy. The newly proposed lossy two-time derivative Lorentzian material (L2TDLM) model ABC allows for these terminations and is presented and implemented here for three-dimensional FDTD simulations. The effect of dielectric losses on several well-known planar microstrip structures is evaluated. It is shown that the inclusion of these losses in FDTD simulations, which is facilitated by the L2TDLM ABC, is, in fact, important to predict the performance of resonant structure on lossy dielectric substrates.

KW - Finite-difference methods

KW - Microwave circuits

KW - Microwave measurements

KW - Numerical analysis

UR - http://www.scopus.com/inward/record.url?scp=0035250096&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0035250096&partnerID=8YFLogxK

U2 - 10.1109/22.903085

DO - 10.1109/22.903085

M3 - Article

AN - SCOPUS:0035250096

SN - 0018-9480

VL - 49

SP - 250

EP - 262

JO - IEEE Transactions on Microwave Theory and Techniques

JF - IEEE Transactions on Microwave Theory and Techniques

IS - 2

ER -

The effect of dielectric loss in FDTD simulations of microstrip structures

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Keywords

ASJC Scopus subject areas

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