TY - JOUR
T1 - The atomic force microscope as a tool to study and manipulate local surface properties
AU - Jaschke, Manfred
AU - Butt, Hans Jürgen
AU - Manne, Srin
AU - Gaub, Hermann E.
AU - Hasemann, Olaf
AU - Krimphove, Frank
AU - Wolff, Elmar K.
N1 - Funding Information:
This work was supported by the Deutsche Forschungs-gemeinschaft Schwerpunktprogramm Neue mikroskop-ische Techniken far Biologie und Medizin.
PY - 1996
Y1 - 1996
N2 - The atomic force microscope (AFM), a prominent member of the new class of scanning near-field microscopes, has become a standard instrument to image the topography of surfaces with high resolution. In addition, the AFM is more and more used to study other local surface properties, like the local surface charge density, the surface energy, or viscoelastic properties. Beside its analytical capabilities, surfaces can be modified with the AFM tip. Examples of all three applications are given and future possibilities are discussed.
AB - The atomic force microscope (AFM), a prominent member of the new class of scanning near-field microscopes, has become a standard instrument to image the topography of surfaces with high resolution. In addition, the AFM is more and more used to study other local surface properties, like the local surface charge density, the surface energy, or viscoelastic properties. Beside its analytical capabilities, surfaces can be modified with the AFM tip. Examples of all three applications are given and future possibilities are discussed.
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U2 - 10.1016/0956-5663(96)83295-7
DO - 10.1016/0956-5663(96)83295-7
M3 - Conference article
AN - SCOPUS:0029946006
SN - 0956-5663
VL - 11
SP - 601
EP - 612
JO - Biosensors and Bioelectronics
JF - Biosensors and Bioelectronics
IS - 6-7
T2 - Proceedings of the 1995 Conference on Artificial Biosensing Interfaces
Y2 - 17 June 1995 through 20 June 1995
ER -