@article{c7aab20d73c642919d7f0edec1db4369,
title = "The atomic force microscope: A tool for science and industry",
abstract = "Images of graphite and RuCl3 show that the atomic force microscope (AFM) is capable of imaging rigid samples with atomic resolution. Images of photographic film showing the emulsion demonstrate the potential of the microscope for industrial quality control. An image of a stoma on a leaf shows that the microscope is gentle enough not to damage surfaces, even of soft biological samples.",
author = "Gould, {S. A.C.} and B. Drake and Prater, {C. B.} and Weisenhorn, {A. L.} and S. Manne and Kelderman, {G. L.} and Butt, {H. J.} and H. Hansma and Hansma, {P. K.} and S. Magonov and Cantow, {H. J.}",
note = "Funding Information: We thank T.R. Albrecht and CF. Quate at Stanford University for providing us with micro-fabricated cantilevers that were essential for our work; P. Maivald, J. Massie, J. Gurley and V. Elings from Digital Instruments for their hardware and software. This project was supported by National Science Foundation - Solid State Physics grant DMR86-13486 (S.M., S.A.C.G., H.H., G.L.K., P.K.H.), the Office of Naval Research (C.B.P., B.D., P.K.H.), IBM Fellowship (A.L.W.), Sonderforschungsbereich 60 of the Deutsche For-schungsgemeinschaft (S.M.) and the Deutsche Forschungsgemeinschaft scholarship Bu 701/1-l (H.-J.B.).",
year = "1990",
month = aug,
doi = "10.1016/0304-3991(90)90011-A",
language = "English (US)",
volume = "33",
pages = "93--98",
journal = "Ultramicroscopy",
issn = "0304-3991",
publisher = "Elsevier",
number = "2",
}