Testing and Calibration Methods for Hybrid PMT/SiPM Gamma-Ray Camera Read-Out Electronics

Maria Ruiz-Gonzalez, R. Garrett Richards, Kimberly J. Doty, Matthew A. Kupinski, Phillip H. Kuo, Michael A. King, Lars R. Furenlid

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

AdaptiSPECT-C is a human brain single-photon emission computed tomography (SPECT) system with 25 stationary scintillation gamma-ray cameras. Each camera has a dedicated read-out electronics system. The back-end electronics consist of a main board which includes, among other features, slots for a system-on-a-module (SoM) and slots for three A/D modules. Each A/D module consists of 28 1-bit sigma-delta modulators (SDMs). Each camera has 25 photomultiplier tube (PMT) channels and 56 silicon photomultiplier (SiPM) channels. Two A/D modules are utilized for the SiPM channels, and one for the PMT channels. We have designed an A/D module tester board for debugging, testing, and calibrating the A/D channels. The tester board takes an input signal from a waveform generator and creates 28 identical copies of the signal. The 28 generated signals are sent to the input of the SDM channels. For rapid testing, the SDM threshold for all channels is controlled by a potentiometer and the DC offset by another potentiometer. The output modulation is sent to bicolor LEDs, where the combined color of the LED pair depends on the SDM rate, which allows us to visually detect modulation variations. The output of the SDM comparator is fed back to the SDM input directly, so that no digital logic is needed for testing. The tester board includes a connector that outputs the 28 generated identical signals to be used as signal input for the main back-end board. This testing method offers a convenient and feasible process to rapidly test, debug, and calibrate the more than 2000 A/D channels in the AdaptiSPECT-C system.

Original languageEnglish (US)
Title of host publication2022 IEEE NSS/MIC RTSD - IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781665488723
DOIs
StatePublished - 2022
Event2022 IEEE Nuclear Science Symposium, Medical Imaging Conference, and Room Temperature Semiconductor Detector Conference, IEEE NSS MIC RTSD 2022 - Milano, Italy
Duration: Nov 5 2022Nov 12 2022

Publication series

Name2022 IEEE NSS/MIC RTSD - IEEE Nuclear Science Symposium, Medical Imaging Conference and Room Temperature Semiconductor Detector Conference

Conference

Conference2022 IEEE Nuclear Science Symposium, Medical Imaging Conference, and Room Temperature Semiconductor Detector Conference, IEEE NSS MIC RTSD 2022
Country/TerritoryItaly
CityMilano
Period11/5/2211/12/22

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Radiology Nuclear Medicine and imaging
  • Instrumentation
  • Nuclear and High Energy Physics

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