Teraherlz birefringence for orientation analysis

Christian Jördens; Maik Scheller; Matthias Wichmann; Martin Mikulics; Karin Wiesauer; Martin Koch

doi:10.1364/AO.48.002037

Teraherlz birefringence for orientation analysis

Christian Jördens, Maik Scheller, Matthias Wichmann, Martin Mikulics, Karin Wiesauer, Martin Koch

Optical Sciences, College of

Research output: Contribution to journal › Article › peer-review

63 Scopus citations

Abstract

A terahertz time-domain spectrometer is employed to study different birefringent samples. We develop a method based on the temporal waveform and the impulse response of a sample to map the anisotropy of their inner structure. To validate our algorithm, we study the polarization-affecting structure of various classes of materials such as crystals, plastics, and natural products. Among all samples we observe the largest birefringence for a rutile crystal with △n = 3.3 at 1 THz.

Original language	English (US)
Pages (from-to)	2037-2044
Number of pages	8
Journal	Applied optics
Volume	48
Issue number	11
DOIs	https://doi.org/10.1364/AO.48.002037
State	Published - Apr 10 2009

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Engineering (miscellaneous)
Electrical and Electronic Engineering

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AU - Scheller, Maik

AU - Wichmann, Matthias

AU - Mikulics, Martin

AU - Wiesauer, Karin

AU - Koch, Martin

PY - 2009/4/10

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AB - A terahertz time-domain spectrometer is employed to study different birefringent samples. We develop a method based on the temporal waveform and the impulse response of a sample to map the anisotropy of their inner structure. To validate our algorithm, we study the polarization-affecting structure of various classes of materials such as crystals, plastics, and natural products. Among all samples we observe the largest birefringence for a rutile crystal with △n = 3.3 at 1 THz.

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Teraherlz birefringence for orientation analysis

Abstract

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