Abstract
Extraordinary magnetoresistance (EMR) devices have been fabricated and characterized at various magnetic fields, operating temperatures, and current excitations. These devices are comprised of nonmagnetic high mobility semiconductors and low resistance metallic contacts and shunts. The resistance of the device is modulated by magnetic fields due to the Lorentz force steering an electron current between the high resistance semiconductor and the low resistance metallic shunt. The EMR devices were tested between 300 K and 5 K in magnetic fields up to 2 T perpendicular to the 2DEG plane and excitation currents up to 100 μA. Magnetoresistance increases as temperature decreases, potentially indicating that EMR persists even as dimensions approach the electron mean free path.
Original language | English (US) |
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Pages (from-to) | 3270-3272 |
Number of pages | 3 |
Journal | IEEE Transactions on Magnetics |
Volume | 42 |
Issue number | 10 |
DOIs | |
State | Published - Oct 2006 |
Externally published | Yes |
Keywords
- Electromagnetic devices
- extraordinary magnetoresistance
- heterojunctions
- magnetic sensors
- semiconductor
- semiconductor devices
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering