@inproceedings{eefe3c5ff45545deb0a2cc62c7999789,
title = "Techniques for improved testability in the IBM ES/9370 system",
abstract = "The authors discuss three techniques used in the IBM ES/9370 series of processors to improve the testability, and hence the quality levels, of card assemblies. First, they investigate the testing requirements and challenges presented by a nonvolatile static RAM and how they were met. Then they introduce a method which uses flush-through logic to provide improved access to array components. Next, the authors discuss how a compare circuit can be used to reduce I/O (input/output) requirements when testing an array. These algorithms were successfully implemented using Programming Language for Testing (PLT). Background information and a detailed methodology for each of the techniques are provided.",
author = "Lusch, {Robert F.} and Sarkany, {Endre F.}",
year = "1989",
language = "English (US)",
isbn = "0818689625",
series = "20 Int Test Conf 1989 ITC",
publisher = "Publ by IEEE",
pages = "290--294",
editor = "Anon",
booktitle = "20 Int Test Conf 1989 ITC",
note = "20th International Test Conference 1989 (ITC) ; Conference date: 29-08-1989 Through 31-08-1989",
}