Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis

Yijun Ding; David Coccarelli; Ava Hurlock; Joel A. Greenberg; Michael Gehm; Amit Ashok

doi:10.1117/12.2558267

Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis

Yijun Ding, David Coccarelli, Ava Hurlock, Joel A. Greenberg, Michael Gehm, Amit Ashok

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Scopus citations

Abstract

We develop a framework to analyze the information content of X-ray measurement data for the task of material discrimination. This task-specific information (TSI) analysis provides valuable information for system design and optimization. We employ Bhattacharyya distance (BD) between measurements of different materials as the TSI metric in our analysis framework, because BD is closely related to the bounds on the probability of error (P_e). We apply this framework to compare an X-ray diffraction-based system with an X-ray attenuation-based system for several materials and different detector geometries.

Original language	English (US)
Title of host publication	Anomaly Detection and Imaging with X-Rays (ADIX) V
Editors	Amit Ashok, Joel A. Greenberg, Michael E. Gehm
Publisher	SPIE
ISBN (Electronic)	9781510635852
DOIs	https://doi.org/10.1117/12.2558267
State	Published - 2020
Event	Anomaly Detection and Imaging with X-Rays (ADIX) V 2020 - None, United States Duration: Apr 27 2020 → May 8 2020

Publication series

Name	Proceedings of SPIE - The International Society for Optical Engineering
Volume	11404
ISSN (Print)	0277-786X
ISSN (Electronic)	1996-756X

Conference

Conference	Anomaly Detection and Imaging with X-Rays (ADIX) V 2020
Country/Territory	United States
City	None
Period	4/27/20 → 5/8/20

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics
Computer Science Applications
Applied Mathematics
Electrical and Electronic Engineering

Access to Document

10.1117/12.2558267

Cite this

Ding, Y., Coccarelli, D., Hurlock, A., Greenberg, J. A., Gehm, M., & Ashok, A. (2020). Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis. In A. Ashok, J. A. Greenberg, & M. E. Gehm (Eds.), Anomaly Detection and Imaging with X-Rays (ADIX) V Article 114040H (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 11404). SPIE. https://doi.org/10.1117/12.2558267

Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis. / Ding, Yijun; Coccarelli, David; Hurlock, Ava et al.
Anomaly Detection and Imaging with X-Rays (ADIX) V. ed. / Amit Ashok; Joel A. Greenberg; Michael E. Gehm. SPIE, 2020. 114040H (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 11404).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Ding, Y, Coccarelli, D, Hurlock, A, Greenberg, JA, Gehm, M & Ashok, A 2020, Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis. in A Ashok, JA Greenberg & ME Gehm (eds), Anomaly Detection and Imaging with X-Rays (ADIX) V., 114040H, Proceedings of SPIE - The International Society for Optical Engineering, vol. 11404, SPIE, Anomaly Detection and Imaging with X-Rays (ADIX) V 2020, None, United States, 4/27/20. https://doi.org/10.1117/12.2558267

Ding Y, Coccarelli D, Hurlock A, Greenberg JA, Gehm M, Ashok A. Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis. In Ashok A, Greenberg JA, Gehm ME, editors, Anomaly Detection and Imaging with X-Rays (ADIX) V. SPIE. 2020. 114040H. (Proceedings of SPIE - The International Society for Optical Engineering). doi: 10.1117/12.2558267

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abstract = "We develop a framework to analyze the information content of X-ray measurement data for the task of material discrimination. This task-specific information (TSI) analysis provides valuable information for system design and optimization. We employ Bhattacharyya distance (BD) between measurements of different materials as the TSI metric in our analysis framework, because BD is closely related to the bounds on the probability of error (Pe). We apply this framework to compare an X-ray diffraction-based system with an X-ray attenuation-based system for several materials and different detector geometries.",

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AB - We develop a framework to analyze the information content of X-ray measurement data for the task of material discrimination. This task-specific information (TSI) analysis provides valuable information for system design and optimization. We employ Bhattacharyya distance (BD) between measurements of different materials as the TSI metric in our analysis framework, because BD is closely related to the bounds on the probability of error (Pe). We apply this framework to compare an X-ray diffraction-based system with an X-ray attenuation-based system for several materials and different detector geometries.

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Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis

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