@inproceedings{3e4fc07890e148a8944a602f0f25e351,
title = "Task-specific information in X-ray diffraction and transmission modalities: A comparative analysis",
abstract = "We develop a framework to analyze the information content of X-ray measurement data for the task of material discrimination. This task-specific information (TSI) analysis provides valuable information for system design and optimization. We employ Bhattacharyya distance (BD) between measurements of different materials as the TSI metric in our analysis framework, because BD is closely related to the bounds on the probability of error (Pe). We apply this framework to compare an X-ray diffraction-based system with an X-ray attenuation-based system for several materials and different detector geometries.",
author = "Yijun Ding and David Coccarelli and Ava Hurlock and Greenberg, {Joel A.} and Michael Gehm and Amit Ashok",
note = "Publisher Copyright: {\textcopyright} 2020 SPIE.; Anomaly Detection and Imaging with X-Rays (ADIX) V 2020 ; Conference date: 27-04-2020 Through 08-05-2020",
year = "2020",
doi = "10.1117/12.2558267",
language = "English (US)",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Amit Ashok and Greenberg, {Joel A.} and Gehm, {Michael E.}",
booktitle = "Anomaly Detection and Imaging with X-Rays (ADIX) V",
}