Tailor the Beam Divergence of High Power VCSEL Arrays by Epitaxial Design

Maik Scheller; Jean Francois Seurin; Hasan Othman; Alexander Miglo; Guoyang Xu; Chuni Ghosh

doi:10.1109/ISLC.2018.8516180

Tailor the Beam Divergence of High Power VCSEL Arrays by Epitaxial Design

Maik Scheller, Jean Francois Seurin, Hasan Othman, Alexander Miglo, Guoyang Xu, Chuni Ghosh

Optical Sciences, College of

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

In this work, we discuss methods to adjust the beam divergence of vertical-cavity surface-emitting lasers (VCSELs) by controlling the transversal lasing modes using different epitaxial designs. We show results of high power, multi-watt VCSEL arrays with emission cones ranging from 10° to 40°.

Original language	English (US)
Title of host publication	26th International Semiconductor Laser Conference, ISLC 2018
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	89-90
Number of pages	2
ISBN (Electronic)	9781538664865
DOIs	https://doi.org/10.1109/ISLC.2018.8516180
State	Published - Oct 30 2018
Event	26th International Semiconductor Laser Conference, ISLC 2018 - Santa Fe, United States Duration: Sep 16 2018 → Sep 19 2018

Publication series

Name	Conference Digest - IEEE International Semiconductor Laser Conference
Volume	2018-September
ISSN (Print)	0899-9406

Other

Other	26th International Semiconductor Laser Conference, ISLC 2018
Country/Territory	United States
City	Santa Fe
Period	9/16/18 → 9/19/18

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Electrical and Electronic Engineering

Access to Document

10.1109/ISLC.2018.8516180

Cite this

Scheller, M., Seurin, J. F., Othman, H., Miglo, A., Xu, G., & Ghosh, C. (2018). Tailor the Beam Divergence of High Power VCSEL Arrays by Epitaxial Design. In 26th International Semiconductor Laser Conference, ISLC 2018 (pp. 89-90). Article 8516180 (Conference Digest - IEEE International Semiconductor Laser Conference; Vol. 2018-September). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISLC.2018.8516180

Tailor the Beam Divergence of High Power VCSEL Arrays by Epitaxial Design. / Scheller, Maik; Seurin, Jean Francois; Othman, Hasan et al.
26th International Semiconductor Laser Conference, ISLC 2018. Institute of Electrical and Electronics Engineers Inc., 2018. p. 89-90 8516180 (Conference Digest - IEEE International Semiconductor Laser Conference; Vol. 2018-September).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Scheller, M, Seurin, JF, Othman, H, Miglo, A, Xu, G & Ghosh, C 2018, Tailor the Beam Divergence of High Power VCSEL Arrays by Epitaxial Design. in 26th International Semiconductor Laser Conference, ISLC 2018., 8516180, Conference Digest - IEEE International Semiconductor Laser Conference, vol. 2018-September, Institute of Electrical and Electronics Engineers Inc., pp. 89-90, 26th International Semiconductor Laser Conference, ISLC 2018, Santa Fe, United States, 9/16/18. https://doi.org/10.1109/ISLC.2018.8516180

Scheller M, Seurin JF, Othman H, Miglo A, Xu G, Ghosh C. Tailor the Beam Divergence of High Power VCSEL Arrays by Epitaxial Design. In 26th International Semiconductor Laser Conference, ISLC 2018. Institute of Electrical and Electronics Engineers Inc. 2018. p. 89-90. 8516180. (Conference Digest - IEEE International Semiconductor Laser Conference). doi: 10.1109/ISLC.2018.8516180

@inproceedings{ac9a2b429e2a44b8aa89cbf3e1fb3539,

title = "Tailor the Beam Divergence of High Power VCSEL Arrays by Epitaxial Design",

abstract = "In this work, we discuss methods to adjust the beam divergence of vertical-cavity surface-emitting lasers (VCSELs) by controlling the transversal lasing modes using different epitaxial designs. We show results of high power, multi-watt VCSEL arrays with emission cones ranging from 10° to 40°.",

author = "Maik Scheller and Seurin, {Jean Francois} and Hasan Othman and Alexander Miglo and Guoyang Xu and Chuni Ghosh",

note = "Publisher Copyright: {\textcopyright} 2018 IEEE.; 26th International Semiconductor Laser Conference, ISLC 2018 ; Conference date: 16-09-2018 Through 19-09-2018",

year = "2018",

month = oct,

day = "30",

doi = "10.1109/ISLC.2018.8516180",

language = "English (US)",

series = "Conference Digest - IEEE International Semiconductor Laser Conference",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

pages = "89--90",

booktitle = "26th International Semiconductor Laser Conference, ISLC 2018",

}

TY - GEN

T1 - Tailor the Beam Divergence of High Power VCSEL Arrays by Epitaxial Design

AU - Scheller, Maik

AU - Seurin, Jean Francois

AU - Othman, Hasan

AU - Miglo, Alexander

AU - Xu, Guoyang

AU - Ghosh, Chuni

PY - 2018/10/30

Y1 - 2018/10/30

N2 - In this work, we discuss methods to adjust the beam divergence of vertical-cavity surface-emitting lasers (VCSELs) by controlling the transversal lasing modes using different epitaxial designs. We show results of high power, multi-watt VCSEL arrays with emission cones ranging from 10° to 40°.

AB - In this work, we discuss methods to adjust the beam divergence of vertical-cavity surface-emitting lasers (VCSELs) by controlling the transversal lasing modes using different epitaxial designs. We show results of high power, multi-watt VCSEL arrays with emission cones ranging from 10° to 40°.

UR - http://www.scopus.com/inward/record.url?scp=85057380345&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85057380345&partnerID=8YFLogxK

U2 - 10.1109/ISLC.2018.8516180

DO - 10.1109/ISLC.2018.8516180

M3 - Conference contribution

AN - SCOPUS:85057380345

T3 - Conference Digest - IEEE International Semiconductor Laser Conference

SP - 89

EP - 90

BT - 26th International Semiconductor Laser Conference, ISLC 2018

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 26th International Semiconductor Laser Conference, ISLC 2018

Y2 - 16 September 2018 through 19 September 2018

ER -

Tailor the Beam Divergence of High Power VCSEL Arrays by Epitaxial Design

Abstract

Publication series

Other

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this