P. I.K. Onorato, M. N. Alexander, C. W. Struck, G. W. Tasker, D. R. Uhlmann

Research output: Contribution to journalConference articlepeer-review


The authors performed new XPS measurements on these glasses, using a Physical Electronics 548 spectrometer using a Mg K alpha x-ray source. The Au-dot calibration method of Stephenson and Binkowski was adapted to the analysis of fracture surfaces formed in high vacuum. The binding energies are thus measured relative to the Fermi level of the insulator through the Fermi level of the Au calibrant. Moreover, the method avoids spurious spectral features caused by uncontrolled charging of the insulating sample. All data were digitized, fed to a mini-computer, signal averaged, deconvoluted to remove the Mg K alpha //2 contribution to the raw width, and smoothed.

Original languageEnglish (US)
Pages (from-to)625-626
Number of pages2
JournalElectrochemical Society Extended Abstracts
StatePublished - 1985

ASJC Scopus subject areas

  • Engineering(all)


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