TY - GEN
T1 - Stochastic power grid analysis considering process variations
AU - Ghanta, Praveen
AU - Vrudhula, Sarma
AU - Panda, Rajendran
AU - Wang, Janet
PY - 2005
Y1 - 2005
N2 - In this paper, we investigate the impact of interconnect and device process variations on voltage fluctuations in power grids. We consider random variations in the power grid's electrical parameters as spatial stochastic processes and propose a new and efficient method to compute the stochastic voltage response of the power grid. Our approach provides an explicit analytical representation of the stochastic voltage response using orthogonal polynomials in a Hubert space. The approach has been implemented in a prototype software called OPERA (Orthogonal Polynomial Expansions for Response Analysis). Use of OPERA on industrial power grids demonstrated speed-ups of up to two orders of magnitude. The results also show a significant variation of about ±35% in the nominal voltage drops at various nodes of the power grids and demonstrate the need for variation-aware power grid analysis.
AB - In this paper, we investigate the impact of interconnect and device process variations on voltage fluctuations in power grids. We consider random variations in the power grid's electrical parameters as spatial stochastic processes and propose a new and efficient method to compute the stochastic voltage response of the power grid. Our approach provides an explicit analytical representation of the stochastic voltage response using orthogonal polynomials in a Hubert space. The approach has been implemented in a prototype software called OPERA (Orthogonal Polynomial Expansions for Response Analysis). Use of OPERA on industrial power grids demonstrated speed-ups of up to two orders of magnitude. The results also show a significant variation of about ±35% in the nominal voltage drops at various nodes of the power grids and demonstrate the need for variation-aware power grid analysis.
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U2 - 10.1109/DATE.2005.282
DO - 10.1109/DATE.2005.282
M3 - Conference contribution
AN - SCOPUS:33646902680
SN - 0769522882
SN - 9780769522883
T3 - Proceedings -Design, Automation and Test in Europe, DATE '05
SP - 964
EP - 969
BT - Proceedings - Design, Automation and Test in Europe, DATE '05
T2 - Design, Automation and Test in Europe, DATE '05
Y2 - 7 March 2005 through 11 March 2005
ER -