Static metrology of the meter-scale deformable heliostat

Yiyang Huang, Roger Angel, Hyukmo Kang, Heejoo Choi, Matt Rademacher, Hill Tailor, Rebecca Su, Daewook Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper describes a heliostat metrology system which is developed based on deflectometry, utilizing a static perforated panel instead of conventional dynamic monitor displays to provide incident rays. The developed method is named static screen deflectometry (SSD). This robust and scalable method is especially valuable for outdoor tests of large reflectors used in concentrating solar-thermal power (CSP) systems. The developed method has been successfully demonstrated on a 2.4 m × 3.3 m float glass deformable reflector bent to focus sunlight at 113 m distance throughout a day. From images obtained from a camera at 50m distance, the reflector surface was measured to an accuracy of less than 1 mrad rms slope error in the full test scope.

Original languageEnglish (US)
Title of host publicationNonimaging Optics
Subtitle of host publicationEfficient Design for Illumination and Concentration XIX
EditorsRoland Winston, Lun Jiang, Hakon Jarand Dugstad Johnsen, Thomas A. Cooper
PublisherSPIE
ISBN (Electronic)9781510679245
DOIs
StatePublished - 2024
EventNonimaging Optics: Efficient Design for Illumination and Concentration XIX 2024 - San Diego, United States
Duration: Aug 18 2024Aug 21 2024

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume13132
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceNonimaging Optics: Efficient Design for Illumination and Concentration XIX 2024
Country/TerritoryUnited States
CitySan Diego
Period8/18/248/21/24

Keywords

  • concentrating solar-thermal power
  • heliostat test
  • reflector metrology
  • static deflectometry

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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