TY - GEN
T1 - Stability analysis and parasitic effects of negative impedance converter circuits
AU - Tang, Qi
AU - Xin, Hao
N1 - Publisher Copyright:
© 2015 IEEE.
PY - 2015/7/24
Y1 - 2015/7/24
N2 - Stability is a major obstacle preventing practical applications of negative impedance converters (NIC) such as electrically small antenna matching. Return ratio method with a mesh or nodal analysis in frequency domain can provide an insight of the overall stability and performance of a NIC. This paper studies the stability of two types of NICs, based on tunneling diode and cross-coupled pair MOSFET. The influence of device capacitances, load impedance, and bias network are discussed.
AB - Stability is a major obstacle preventing practical applications of negative impedance converters (NIC) such as electrically small antenna matching. Return ratio method with a mesh or nodal analysis in frequency domain can provide an insight of the overall stability and performance of a NIC. This paper studies the stability of two types of NICs, based on tunneling diode and cross-coupled pair MOSFET. The influence of device capacitances, load impedance, and bias network are discussed.
KW - Negative impedance converter
KW - Normalized determined factor
KW - stability
UR - http://www.scopus.com/inward/record.url?scp=84946043932&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84946043932&partnerID=8YFLogxK
U2 - 10.1109/MWSYM.2015.7166891
DO - 10.1109/MWSYM.2015.7166891
M3 - Conference contribution
AN - SCOPUS:84946043932
T3 - 2015 IEEE MTT-S International Microwave Symposium, IMS 2015
BT - 2015 IEEE MTT-S International Microwave Symposium, IMS 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - IEEE MTT-S International Microwave Symposium, IMS 2015
Y2 - 17 May 2015 through 22 May 2015
ER -