Spectropolarimetry of electro optical materials

Dennis H. Goldstein, Russell A. Chipman, David B. Chenault

Research output: Contribution to journalArticlepeer-review

2 Scopus citations


This paper treats the fundamentals of infrared spectropolarimetry as a step in understanding and designing better spatial light modulators. It describes the issues in converting a Fourier transform tspectrometer to perform spectropolarimetric measurements, and includes mathematics to interpret the resulting spectropolarimetric data. Two distinct differences exist between this proposed instrumentation and previous infrared crystal optics studies; 1.) this instrument acquires data at all wavelengths within its spectral range, and 2.) it measures Mueller polarization matrices. Conventional measurements with laser polarimeters take birefringence data with applied fields at a few laser wavelengths. With the spectropolarimeter, data is obtained on and near absorption bands where the most interesting phenomenae occur. By measuring Mueller matrices as a function of wavelength, data is acquired on polarization and scattering, effects which will ultimately limit the performance of a modulating crystal. Thus, more data is available on which to compare materials and optimise modulator designs. Better modulators must result from such investigations.

Original languageEnglish (US)
Pages (from-to)56-73
Number of pages18
JournalProceedings of SPIE - The International Society for Optical Engineering
StatePublished - Jun 29 1988

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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