@inproceedings{eb95e246bbd94f0fbaefe24374b76170,
title = "Spectral characterization of linear isotropic and anisotropic dielectric materials using terahertz measurement systems",
abstract = "In this study, quasi-optical techniques are used to evaluate the properties of dielectric substrates at millimeter wave frequencies. Anisotropy with respect to wave polarization was observed in the composite materials using several instruments including the FTS, TDS, and THz VNA. The measurements were carried out from 200 GHz to 3000 GHz (3 THz ) depending on the instrument. Material loss deviated significantly above 500 GHz. Uniform plastics such as H/LDPE polyethylene were well behaved by comparison.",
keywords = "Dielectric material characterization, Fourier transforms, anisotropic, loss tangent, measurements, nondestructive testing, terahertz, time domain",
author = "Jeffrey Seligman and Christopher Walker and Ben Sternberg and Christopher Green",
note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 88th ARFTG Microwave Measurement Conference, ARFTG 2016 ; Conference date: 08-12-2016 Through 09-12-2016",
year = "2017",
month = feb,
day = "1",
doi = "10.1109/ARFTG.2016.7839724",
language = "English (US)",
series = "88th ARFTG Microwave Measurement Conference: Power Amplifiers and Systems Design for Wireless Application, ARFTG 2016",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
booktitle = "88th ARFTG Microwave Measurement Conference",
}