Specifying polarimetric tolerances of a high-resolution imaging multiple-species atmospheric profiler (HiMAP)

Juliana Mae Richter, Russell Chipman, Brian Daugherty, David J. Diner, Annmarie Eldering, Jason J. Hyon, Meredith Kupinski, Jessica L. Neu, Dejian Fu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations


The High-resolution Imaging Multiple-species Atmospheric Profiler (HiMAP) is an ultraviolet imaging spectro-polarimeter in development at the Jet Propulsion Laboratory for measuring O3 and NO2 concentrations in the troposphere from an airborne platform or satellite. In this paper: (1) the HiMAP design is illustrated and modeled using 3D polarization ray tracing calculus, (2) the dependency between the condition number of the systems polarization measurement matrix and properties of individual optical components is used as a method for tolerancing, and (3) the polarimeter capabilities of manufacturable thin film designs of polarizing and non-polarizing beam splitters is explored using numerical methods. The condition number of an optical system is calculated from a polarization ray tracing (PRT) matrix model of the polarimeter. Deviations of the condition number are calculated for non-ideal polarization elements and coatings to understand component and alignment tolerances.

Original languageEnglish (US)
Title of host publicationPhotonic Instrumentation Engineering VI
EditorsYakov G. Soskind
ISBN (Electronic)9781510624924
StatePublished - 2019
EventPhotonic Instrumentation Engineering VI 2019 - San Francisco, United States
Duration: Feb 5 2019Feb 7 2019

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


ConferencePhotonic Instrumentation Engineering VI 2019
Country/TerritoryUnited States
CitySan Francisco


  • polarization
  • remote sensing
  • spectroscopy
  • tolerance analysis.

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering


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