Spatially resolved spectroscopy of monolayer graphene on SiO2

A. Deshpande; W. Bao; F. Miao; C. N. Lau; B. J. Leroy

doi:10.1103/PhysRevB.79.205411

Spatially resolved spectroscopy of monolayer graphene on SiO2

A. Deshpande, W. Bao, F. Miao, C. N. Lau, B. J. Leroy

Physics

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221 Scopus citations

Abstract

We carried out scanning tunneling spectroscopy measurements on exfoliated monolayer graphene on SiO2 to probe the correlation between its electronic and structural properties. Maps of the local density of states are characterized by electron and hole puddles that arise due to long-range intravalley scattering from intrinsic ripples in graphene and random-charged impurities. At low energy, we observe short-range intervalley scattering which we attribute to lattice defects. Our results demonstrate that the electronic properties of graphene are influenced by intrinsic ripples, defects, and the underlying SiO2 substrate.

Original language	English (US)
Article number	205411
Journal	Physical Review B - Condensed Matter and Materials Physics
Volume	79
Issue number	20
DOIs	https://doi.org/10.1103/PhysRevB.79.205411
State	Published - May 1 2009

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Condensed Matter Physics

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10.1103/PhysRevB.79.205411

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@article{30ab574a0b554c52aa82bc6af11b5605,

title = "Spatially resolved spectroscopy of monolayer graphene on SiO2",

abstract = "We carried out scanning tunneling spectroscopy measurements on exfoliated monolayer graphene on SiO2 to probe the correlation between its electronic and structural properties. Maps of the local density of states are characterized by electron and hole puddles that arise due to long-range intravalley scattering from intrinsic ripples in graphene and random-charged impurities. At low energy, we observe short-range intervalley scattering which we attribute to lattice defects. Our results demonstrate that the electronic properties of graphene are influenced by intrinsic ripples, defects, and the underlying SiO2 substrate.",

author = "A. Deshpande and W. Bao and F. Miao and Lau, {C. N.} and Leroy, {B. J.}",

year = "2009",

month = may,

day = "1",

doi = "10.1103/PhysRevB.79.205411",

language = "English (US)",

volume = "79",

journal = "Physical Review B - Condensed Matter and Materials Physics",

issn = "1098-0121",

publisher = "American Institute of Physics Publising LLC",

number = "20",

}

TY - JOUR

T1 - Spatially resolved spectroscopy of monolayer graphene on SiO2

AU - Deshpande, A.

AU - Bao, W.

AU - Miao, F.

AU - Lau, C. N.

AU - Leroy, B. J.

PY - 2009/5/1

Y1 - 2009/5/1

N2 - We carried out scanning tunneling spectroscopy measurements on exfoliated monolayer graphene on SiO2 to probe the correlation between its electronic and structural properties. Maps of the local density of states are characterized by electron and hole puddles that arise due to long-range intravalley scattering from intrinsic ripples in graphene and random-charged impurities. At low energy, we observe short-range intervalley scattering which we attribute to lattice defects. Our results demonstrate that the electronic properties of graphene are influenced by intrinsic ripples, defects, and the underlying SiO2 substrate.

AB - We carried out scanning tunneling spectroscopy measurements on exfoliated monolayer graphene on SiO2 to probe the correlation between its electronic and structural properties. Maps of the local density of states are characterized by electron and hole puddles that arise due to long-range intravalley scattering from intrinsic ripples in graphene and random-charged impurities. At low energy, we observe short-range intervalley scattering which we attribute to lattice defects. Our results demonstrate that the electronic properties of graphene are influenced by intrinsic ripples, defects, and the underlying SiO2 substrate.

UR - http://www.scopus.com/inward/record.url?scp=67049159860&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=67049159860&partnerID=8YFLogxK

U2 - 10.1103/PhysRevB.79.205411

DO - 10.1103/PhysRevB.79.205411

M3 - Article

AN - SCOPUS:67049159860

SN - 1098-0121

VL - 79

JO - Physical Review B - Condensed Matter and Materials Physics

JF - Physical Review B - Condensed Matter and Materials Physics

IS - 20

M1 - 205411

ER -

Spatially resolved spectroscopy of monolayer graphene on SiO2

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