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Soft X-ray microscopy; a new technology for examination of parasitic specimens

  • W. J. Kozek
  • , A. Nair
  • , G. Denbeaux
  • , C. Larabell
  • , J. Brown
  • , C. R. Sterling
  • , S. Garlapati
  • , C. C. Wang
  • , W. Meyer-Ilse

    Research output: Contribution to journalArticlepeer-review

    Original languageEnglish (US)
    Pages (from-to)1452-1453
    Number of pages2
    JournalMicroscopy and Microanalysis
    Volume9
    Issue numberSUPPL. 2
    DOIs
    StatePublished - 2003

    ASJC Scopus subject areas

    • Instrumentation

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