Soft X-ray microscopy; a new technology for examination of parasitic specimens

W. J. Kozek, A. Nair, G. Denbeaux, C. Larabell, J. Brown, C. R. Sterling, S. Garlapati, C. C. Wang, W. Meyer-Ilse

    Research output: Contribution to journalArticlepeer-review

    1 Scopus citations
    Original languageEnglish (US)
    Pages (from-to)1452-1453
    Number of pages2
    JournalMicroscopy and Microanalysis
    Issue numberSUPPL. 2
    StatePublished - 2003

    ASJC Scopus subject areas

    • Instrumentation

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