Soft X-ray microscopy; a new technology for examination of parasitic specimens

W. J. Kozek; A. Nair; G. Denbeaux; C. Larabell; J. Brown; C. R. Sterling; S. Garlapati; C. C. Wang; W. Meyer-Ilse

doi:10.1017/s1431927603447260

Soft X-ray microscopy; a new technology for examination of parasitic specimens

W. J. Kozek, A. Nair, G. Denbeaux, C. Larabell, J. Brown, C. R. Sterling, S. Garlapati, C. C. Wang, W. Meyer-Ilse

Research output: Contribution to journal › Article › peer-review

Original language	English (US)
Pages (from-to)	1452-1453
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	9
Issue number	SUPPL. 2
DOIs	https://doi.org/10.1017/s1431927603447260
State	Published - 2003

ASJC Scopus subject areas

Instrumentation

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10.1017/s1431927603447260

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title = "Soft X-ray microscopy; a new technology for examination of parasitic specimens",

author = "Kozek, {W. J.} and A. Nair and G. Denbeaux and C. Larabell and J. Brown and Sterling, {C. R.} and S. Garlapati and Wang, {C. C.} and W. Meyer-Ilse",

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T1 - Soft X-ray microscopy; a new technology for examination of parasitic specimens

AU - Kozek, W. J.

AU - Nair, A.

AU - Denbeaux, G.

AU - Larabell, C.

AU - Brown, J.

AU - Sterling, C. R.

AU - Garlapati, S.

AU - Wang, C. C.

AU - Meyer-Ilse, W.

PY - 2003

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JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - SUPPL. 2

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Soft X-ray microscopy; a new technology for examination of parasitic specimens

ASJC Scopus subject areas

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