Small craft ID criteria (N50/V50) for short wave infrared sensors in maritime security

Keith Krapels, Ronald G. Driggers, Paul Larson, Jose Garcia, Barry Walden, Sameer Agheera, Dawne Deaver, Jonathan Hixson, Evelyn Boettcher

Research output: Chapter in Book/Report/Conference proceedingConference contribution

13 Scopus citations

Abstract

The need for Anti-Terrorism and Force Protection (AT/FP), for both shore and sea platform protection, has resulted in a need for imager design and evaluation tools which can predict field performance against maritime asymmetric threats. In the design of tactical imaging systems for target acquisition, a discrimination criterion is required for successful sensor realization. It characterizes the difficulty of the task being performed by the observer and varies for different target sets. This criterion is used in both assessment of existing infrared sensor and in the design of new conceptual sensors. In this experiment, we collected 8 small craft signatures (military and civilian) in the short wave infrared (SWIR) band during the day. These signatures were processed to determine the targets' characteristic dimension and contrast. They were also processed to bandlimit the signature's spatial information content (simulating longer range) and a perception experiment was performed to determine the task difficulty (N50 and V50). The results are presented in this paper and can be used for maritime security imaging sensor design and evaluation.

Original languageEnglish (US)
Title of host publicationInfrared Imaging Systems
Subtitle of host publicationDesign, Analysis, Modeling, and Testing XIX
DOIs
StatePublished - 2008
Externally publishedYes
EventInfrared Imaging Systems: Design, Analysis, Modeling, and Testing XIX - Orlando, FL, United States
Duration: Mar 18 2008Mar 19 2008

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6941
ISSN (Print)0277-786X

Conference

ConferenceInfrared Imaging Systems: Design, Analysis, Modeling, and Testing XIX
Country/TerritoryUnited States
CityOrlando, FL
Period3/18/083/19/08

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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