@inproceedings{17a0894c1c9f4e2e8d14439c0911305f,
title = "Simultaneous determination of thickness and refractive indices of birefringent wafer by simple transmission measurement",
abstract = "We demonstrate a method for determining the principal indices of refraction and the thickness of a birefringent wafer. Simply, the light transmittance was measured while rotating the wafer. The directly transmitted beam makes interference with those multiply reflected between the surfaces as in a Fabry-P{\'e}rot etalon, producing an interferogram as a function of angle of incidence. We applied this method to a LiNbO3 wafer, determining the absolute values of ordinary and extraordinary indices with an uncertainty of 10-5. In addition to the measurement accuracy, the major advantages of our method are extreme simplicity and environmental robustness in the experiment.",
keywords = "Birefringence, Index of refraction, Interferometer",
author = "Choi, {Hee Joo} and Ryu, {Jun Yeol} and Myoungsik Cha",
note = "Publisher Copyright: {\textcopyright} 2014 SPIE.; Interferometry XVII: Techniques and Analysis ; Conference date: 17-08-2014 Through 19-08-2014",
year = "2014",
doi = "10.1117/12.2063280",
language = "English (US)",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Katherine Creath and Jan Burke and Joanna Schmit",
booktitle = "Interferometry XVII",
}