Simulating medium-spectral-resolution exoplanet characterization with SCALES angular/reference differential imaging

Aditi Desai, Stephanie E. Sallum, Ravinder Banyal, Natalie Batalha, Natasha Batalha, Geoff Blake, Tim Brandt, Zack Briesemeister, Katherine de Kleer, Imke de Pater, Josh Eisner, Wen Fai Fong, Tom Greene, Mitsuhiko Honda, Isabel Kain, Charlie Kilpatrick, Mackenzie Lach, Mike Liu, Bruce Macintosh, Raquel A. MartinezDimitri Mawet, Brittany Miles, Caroline Morley, Diana Powell, Patrick Sheehan, Andrew J. Skemer, Justin Spilker, R. Deno Stelter, Jordan Stone, Arun Surya, Sivarani Thirupathi, Kevin Wagner, Yifan Zhou

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Scopus citations

Abstract

SCALES (Slicer Combined with Array of Lenslets for Exoplanet Spectroscopy) is a 2 - 5 micron high-contrast lenslet-based integral field spectrograph (IFS) designed to characterize exoplanets and their atmospheres. The SCALES medium-spectral-resolution mode uses a lenslet subarray with a 0.34 x 0.36 arcsecond field of view which allows for exoplanet characterization at increased spectral resolution. We explore the sensitivity limitations of this mode by simulating planet detections in the presence of realistic noise sources. We use the SCALES simulator scalessim to generate high-fidelity mock observations of planets that include speckle noise from their host stars, as well as other atmospheric and instrumental noise effects. We employ both angular and reference differential imaging as methods of disentangling speckle noise from the injected planet signals. These simulations allow us to assess the feasibility of speckle deconvolution for SCALES medium resolution data, and to test whether one approach outperforms another based on planet angular separations and contrasts.

Original languageEnglish (US)
Title of host publicationTechniques and Instrumentation for Detection of Exoplanets XI
EditorsGarreth J. Ruane
PublisherSPIE
ISBN (Electronic)9781510665743
DOIs
StatePublished - 2023
EventTechniques and Instrumentation for Detection of Exoplanets XI 2023 - San Diego, United States
Duration: Aug 21 2023Aug 24 2023

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume12680
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceTechniques and Instrumentation for Detection of Exoplanets XI 2023
Country/TerritoryUnited States
CitySan Diego
Period8/21/238/24/23

Keywords

  • ADI
  • RDI
  • SCALES
  • exoplanet characterization
  • high-contrast spectroscopy

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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