@inproceedings{57b6156e99c64ea6a77c38335dcf7fe5,
title = "SIL-STED microscopy technique enhancing super-resolution of fluorescence microscopy",
abstract = "We have characterized a new type STED microscope which combines a high numerical aperture (NA) optical head with a solid immersion lens (SIL), and we call it as SIL-STED microscope. The advantage of a SIL-STED microscope is that its high NA of the SIL makes it superior to a general STED microscope in lateral resolution, thus overcoming the optical diffraction limit at the macromolecular level and enabling advanced super-resolution imaging of cell surface or cell membrane structure and function Do. This study presents the first implementation of higher NA illumination in a STED microscope limiting the fluorescence lateral resolution to about 40 nm. The refractive index of the SIL which is made of material KTaO3 is about 2.23 and 2.20 at a wavelength of 633 nm and 780 nm which are used for excitation and depletion in STED imaging, respectively. Based on the vector diffraction theory, the electric field focused by the SILSTED microscope is numerically calculated so that the numerical results of the point dispersion function of the microscope and the expected resolution could be analyzed. For further investigation, fluorescence imaging of nano size fluorescent beads is fulfilled to show improved performance of the technique.",
keywords = "Fluorescence microscopy, High numerical aperture, Solid immersion lens, Stimulated emission depletion (STED) microscopy, Superresolution",
author = "Ryuichi Katayama and Yuzuru Takashima and Park, {No Cheol} and Geon Lim and Lee, {Won Sup} and Hyungbae Moon and Choi, {Guk Jong} and Park, {Young Pil}",
note = "Funding Information: This study was supported by the LG Electronics Co., Ltd. (No. 2017-11-0603) and the Yonsei University Research Fund (Post Doc. Researcher Supporting Program) of 2016 (project no.: 2016-12-0013). Publisher Copyright: {\textcopyright} 2017 SPIE.; Optical Data Storage 2017: From New Materials to New Systems, ODS 2017 ; Conference date: 06-08-2017",
year = "2017",
doi = "10.1117/12.2275957",
language = "English (US)",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Ryuichi Katayama and Yuzuru Takashima",
booktitle = "Optical Data Storage 2017",
}