Signal nonlinearity measurements and corrections in MWIR and LWIR HgCdTe H2RG arrays for NEO Surveyor

Gregory R. Zengilowski, Craig W. McMurtry, Judith L. Pipher, Nicholas S. Reilly, William J. Forrest, Mario S. Cabrera, Meghan L. Dorn, Andre F. Wong, A. K. Mainzer

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations

Abstract

The depletion region around each p-n junction in HgCdTe HAWAII-2RG detector arrays decreases in volume as charge is collected, causing the pixel capacitance to change continuously throughout an integration period. This changing capacitance manifests as a steadily decreasing measured signal rate while observing a constant flux. Ignoring this nonlinear response to signal accumulation can lead to underestimating the number of detected pho- tons by as much as 10%. Presented here are two methods, one simple and one complex, of measuring this signal nonlinearity and a theoretical framework behind a nonlinearity correction method. Additionally, experimental data are compared with simulations to explain methods to reduce noise in the nonlinearity measurement and identify deviations from the expected behavior that merit further study.

Original languageEnglish (US)
Title of host publicationX-Ray, Optical, and Infrared Detectors for Astronomy IX
EditorsAndrew D. Holland, James Beletic
PublisherSPIE
ISBN (Electronic)9781510636958
DOIs
StatePublished - 2020
Externally publishedYes
EventX-Ray, Optical, and Infrared Detectors for Astronomy IX 2020 - Virtual, Online, United States
Duration: Dec 14 2020Dec 22 2020

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume11454
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

ConferenceX-Ray, Optical, and Infrared Detectors for Astronomy IX 2020
Country/TerritoryUnited States
CityVirtual, Online
Period12/14/2012/22/20

Keywords

  • HgCdTe
  • Infrared Detector
  • LWIR
  • MWIR
  • Nearest Neighbor Interactions
  • Nonlinearity

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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