Abstract
Measuring surface topography of translucent objects with phase shifting fringe projection method is a challenge because of the reduced fringe contrast due to the scattering inside the object. The internal structure also has an impact to the measurement. We present a new phase shifting fringe project imaging method to measure three-dimensional surface shapes of translucent objects. This method employs polarized short wavelength to increase the fringe contrast by reducing the internal scattered light from reaching the camera.
Original language | English (US) |
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Article number | 014104 |
Journal | Optical Engineering |
Volume | 53 |
Issue number | 1 |
DOIs | |
State | Published - Jan 2014 |
Keywords
- fringe projection
- phase shifting
- three-dimensional surface measurement
- translucent object
ASJC Scopus subject areas
- Atomic and Molecular Physics, and Optics
- General Engineering