@article{bf93d2382fe54a92954570684c30aa49,
title = "Sequential back analysis of spatial distribution of geomechanical properties around an unlined rock cavern",
abstract = "This paper develops a sequential displacement data collection and back analysis approach for mapping spatially distributed Young's modulus (E) in a rock mass during the excavation of an unlined rock cavern (URC). Results show that this approach provides an unbiased estimate of the E field and its uncertainty. It also reveals a more detailed E distribution than kriging approach, which is based on samples of E values from boreholes before excavations. Further, predicted shear strain distribution and displacement of cavern periphery based on the estimates from this approach are more accurate than those based on the kriging estimate.",
keywords = "Displacement back analysis, Heterogeneity, Successive linear estimator, Unlined rock cavern, Young's modulus",
author = "Xu Gao and Yan, {E. Chuan} and Yeh, {Tian Chyi Jim} and Wang, {Yu Li} and Cai, {Jing Sen} and Hao, {Yong Hong}",
note = "Funding Information: The first author gratefully acknowledges financial support from China Scholarship Council (CSC, No. 201606410033 ). The first and second authors acknowledge the support by the National Natural Science Foundation of China (Grant Nos. 41172282 and 41672313 ). This research is in part by CRDF under the award number ( DAA2-15-61224-1 ): Hydraulic tomography in shallow alluvial sediments: Nile River Valley, Egypt. T.-C. J. Yeh also acknowledges the Global Expert award through Tianjin Normal University from the Thousand Talents Plan of Tianjin City. The fifth author acknowledges the support by the Fundamental Research Funds for the Central Universities , China University of Geosciences (Wuhan) (Grant No. CUG170686 ). Publisher Copyright: {\textcopyright} 2018 Elsevier Ltd",
year = "2018",
month = jul,
doi = "10.1016/j.compgeo.2018.03.007",
language = "English (US)",
volume = "99",
pages = "177--190",
journal = "Computers and Geotechnics",
issn = "0266-352X",
publisher = "Elsevier BV",
}