Abstract
The sensitometric response of Cd 1-xZn xTe semiconductor detectors using a geometrical chest phantom, within the X-ray diagnostic energy range, has been studied with the aim of optimizing the image quality parameters of these solid state-ionization devices. In addition, the dependence of the spatial resolution of a planar Cd 1-xZn xTe substrate on the phantom thickness has been experimentally determined. The results of this study indicate that Cd 1-xZn xTe detectors exhibit a high signal-to-noise ratio (S/N).
Original language | English (US) |
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Pages (from-to) | 252-255 |
Number of pages | 4 |
Journal | IEEE Transactions on Instrumentation and Measurement |
Volume | 47 |
Issue number | 1 |
DOIs | |
State | Published - 1998 |
Externally published | Yes |
Keywords
- CdZnTe semiconductors
- Chest radiography
- Detector technology
- Digital radiography
- Medical imaging sensors
ASJC Scopus subject areas
- Instrumentation
- Electrical and Electronic Engineering