@inproceedings{e766257d925348fb8584661f76babb5d,
title = "Scattering loss in thin, shallow-ridge silion-on-insulator waveguides",
abstract = "Roughness induced scattering in thin, shallow-ridge silicon on insulator waveguides is analyzed by coupled mode theory and verified experimentally. Roughness in different waveguide regions causes different scattering natures of TM and TE modes.",
author = "Nguyen, \{Thach G.\} and Tummidi, \{Ravi S.\} and Robert Pafchek and Koch, \{Thomas L.\} and Arnan Mitchell",
year = "2012",
language = "English (US)",
isbn = "9781557529435",
series = "Optics InfoBase Conference Papers",
booktitle = "Quantum Electronics and Laser Science Conference, QELS 2012",
note = "Quantum Electronics and Laser Science Conference, QELS 2012 ; Conference date: 06-05-2012 Through 11-05-2012",
}